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Onto Innovation Inc.

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ONTO Stock Insider Trading Activity
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Recently reported changes by institutional investors

Quarterly net insider trading by ONTO's directors and management

Government lobbying spending instances

  • $30,000 Oct 30, 2024 Issue: Science/Technology Trade (domestic/foreign)
  • $30,000 Jul 18, 2024 Issue: Science/Technology Trade (domestic/foreign)
  • $30,000 May 07, 2024 Issue: Science/Technology Trade (domestic/foreign)
  • $30,000 Jan 22, 2024 Issue: Science/Technology Trade (domestic/foreign)
  • $30,000 Oct 20, 2023 Issue: Science/Technology Trade (domestic/foreign)
  • $30,000 Aug 02, 2023 Issue: Science/Technology Trade (domestic/foreign)
  • $30,000 Apr 20, 2023 Issue: Science/Technology Trade (domestic/foreign)
  • $30,000 Feb 06, 2023 Issue: Science/Technology Trade (domestic/foreign)
  • $30,000 Nov 11, 2022 Issue: Science/Technology Trade (domestic/foreign)
  • $30,000 Aug 09, 2022 Issue: Science/Technology Trade (domestic/foreign)
  • $30,000 Apr 26, 2022 Issue: Science/Technology Trade (domestic/foreign)
  • $40,000 Jan 20, 2022 Issue: Science/Technology Trade (domestic/foreign)
  • $30,000 Nov 04, 2021 Issue: Trade (domestic/foreign) Science/Technology
  • $20,000 Jul 21, 2021 Issue: Trade (domestic/foreign) Science/Technology

Estimated quarterly lobbying spending

U.S. Patents

New patents grants

  • Patent Title: Substrate mapping using deep neural-networks Oct. 29, 2024
  • Patent Title: Semiconductor substrate yield prediction based on spectra data from multiple substrate dies Oct. 08, 2024
  • Patent Title: Measurements of structures in presence of signal contaminations Sep. 17, 2024
  • Patent Title: Non-destructive inspection and manufacturing metrology systems and methods Sep. 17, 2024
  • Patent Title: Effective cell approximation model for logic structures Jun. 18, 2024
  • Patent Title: Characterization of patterned structures using acoustic metrology May. 21, 2024
  • Patent Title: Enhanced heat transfer in liquefied gas cooled detector Feb. 27, 2024
  • Patent Title: Apparatus and method for multiple source excitation raman spectroscopy Jan. 16, 2024
  • Patent Title: Wafer-level package assembly handling Nov. 07, 2023
  • Patent Title: Target for optical measurement of trenches Nov. 07, 2023
  • Patent Title: System and method for correcting overlay errors in a lithographic process Jun. 27, 2023
  • Patent Title: Opto-acoustic measurement of a transparent film stack Jun. 06, 2023
  • Patent Title: Wafer inspection system including a laser triangulation sensor Feb. 14, 2023
  • Patent Title: System and method for optimizing a lithography exposure process Dec. 20, 2022
  • Patent Title: Beamsplitter based ellipsometer focusing system Jul. 12, 2022
  • Patent Title: Conformal stage Jun. 07, 2022
  • Patent Title: Interferometry with pixelated color discriminating elements combined with pixelated polarization masks Jun. 07, 2022
  • Patent Title: Focus system for oblique optical metrology device May. 31, 2022
  • Patent Title: Fast generalized multi-wavelength ellipsometer May. 31, 2022
  • Patent Title: Vortex polarimeter May. 31, 2022
  • Patent Title: Wafer singulation process control Apr. 26, 2022
  • Patent Title: Active damper for semiconductor metrology and inspection systems Mar. 22, 2022
  • Patent Title: On-axis dynamic interferometer and optical imaging systems employing the same Mar. 01, 2022
  • Patent Title: Optical metrology device using numerical aperture reduction Nov. 02, 2021
  • Patent Title: Sample surface polarization modification in interferometric defect inspection Oct. 19, 2021
  • Patent Title: System and method for optimizing a lithography exposure process Sep. 21, 2021
  • Patent Title: Calibration of azimuth angle for optical metrology stage using grating-coupled surface plasmon resonance Aug. 03, 2021
  • Patent Title: Sample inspection using topography Mar. 02, 2021
  • Patent Title: Sub-resolution defect detection Mar. 02, 2021
  • Patent Title: Non-adhesive mounting assembly for a tall rochon polarizer Feb. 09, 2021
  • Patent Title: Optical metrology system using infrared wavelengths Jan. 26, 2021
  • Patent Title: Interferometer with pixelated phase shift mask Nov. 10, 2020
  • Patent Title: Foup purge shield Sep. 22, 2020
  • Patent Title: Light source failure identification in an optical metrology device Sep. 15, 2020
  • Patent Title: Optical metrology device for measuring samples having thin or thick films Aug. 18, 2020
  • Patent Title: Surface height determination of transparent film Feb. 11, 2020
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ONTO Stock Smart Score

The Quiver Smart Score combines our data on Congress Trading, Lobbying, Insider Trading, CNBC Mentions and more to provide a comprehensive view of the strength of a stock's underlying data.

The Smart Score grades stocks on a scale of 1 (weakest) to 10 (strongest) based on the strength of the underlying data.
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